Rapid Cross-Section TEM Specimen Preparation of III-V Materials
نویسندگان
چکیده
منابع مشابه
TEM specimen preparation techniques
Transmission electron microscopy (TEM) is a powerful tool for the investigation of the microstructure of materials, providing crystallographic information and composition at the nanometer scale. For such studies, samples should be transparent to the electron beam. In this review, TEM sample preparation techniques for different classes of materials, such as metals and alloys, multilayered coatin...
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Article history: Received 25 May 2015 Received in revised form 3 July 2015 Accepted 6 July 2015 Available online xxxx
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ژورنال
عنوان ژورنال: Microscopy Today
سال: 2003
ISSN: 1551-9295,2150-3583
DOI: 10.1017/s1551929500052305